Ferroelectric behavior and NCFETs - TCAD Simulation. Asian Journal of Electrical and Electronic Engineering, [S. l.], v. 1, n. 1, p. 30–41, 2021. DOI: 10.69955/ajoeee.2021.v1i1.14. Disponível em: https://alambiblio.com/ojs/index.php/ajoeee/article/view/14.. Acesso em: 25 jul. 2024.