DARMIS, Naimah; ALAM, AHM Zahirul; MOHD HASHIM, Muhaimin. Ferroelectric behavior and NCFETs - TCAD Simulation. Asian Journal of Electrical and Electronic Engineering, [S. l.], v. 1, n. 1, p. 30–41, 2021. Disponível em: https://alambiblio.com/ojs/index.php/ajoeee/article/view/14. Acesso em: 15 apr. 2024.